Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6821868 | Method of forming nitrogen enriched gate dielectric with low effective oxide thickness | T. L. Lee, Chia-Lin Chen | 2004-11-23 |
| 6743715 | Dry clean process to improve device gate oxide integrity (GOI) and reliability | Yu Bin Huang, Yu Hwa Lee, Chin Shiung Ho | 2004-06-01 |