Issued Patents 2004
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6710889 | Method for improved dielectric layer metrology calibration | Pey-Yuan Lee, Chi-Shen Lo, Han-Liang Tseng, Wei-Ming You, Yi-Hung Chen | 2004-03-23 |
SH
Sian-Ren Horng
Overall (2004): #76,192 of 270,089Top 30%
1
Patents 2004