CL

Chi-Shen Lo

TSMC: 1 patents #234 of 898Top 30%
Overall (2004): #246,495 of 270,089Top 95%
1
Patents 2004

Issued Patents 2004

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6710889 Method for improved dielectric layer metrology calibration Pey-Yuan Lee, Sian-Ren Horng, Han-Liang Tseng, Wei-Ming You, Yi-Hung Chen 2004-03-23