Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6795168 | Method and apparatus for exposing a wafer using multiple masks during an integrated circuit manufacturing process | Yao-Ting Wang, Christophe Pierrat | 2004-09-21 |
| 6757645 | Visual inspection and verification system | Yao-Ting Wang, Yagyensh C. Pati, Linard Karklin | 2004-06-29 |
| 6721928 | Verification utilizing instance-based hierarchy management | Christophe Pierrat, Chin-Hsen Lin, Yao-Ting Wang | 2004-04-13 |