Issued Patents 2004
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6766047 | Defect inspection method for three-dimensional object | Yutaka Muraki, Masami Takeshi, Naoya Murota | 2004-07-20 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6766047 | Defect inspection method for three-dimensional object | Yutaka Muraki, Masami Takeshi, Naoya Murota | 2004-07-20 |