Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6836561 | Method and system for detecting a defect in projected portions of an object having the projected portions formed in the same shape with a predetermined pitch along an arc | Tsuyoshi Nakajima, Naoya Murota, Yutaka Miyahara | 2004-12-28 |
| 6766047 | Defect inspection method for three-dimensional object | Yutaka Muraki, Taro Akabane, Naoya Murota | 2004-07-20 |