Issued Patents 2004
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6791347 | Probe apparatus applicable to a wafer level burn-in screening | Masaaki Ishizaka | 2004-09-14 |
YN
Yumio Nakamura
Overall (2004): #79,736 of 270,089Top 30%
1
Patents 2004