Issued Patents 2004
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6791347 | Probe apparatus applicable to a wafer level burn-in screening | Yumio Nakamura | 2004-09-14 |
MI
Masaaki Ishizaka
Overall (2004): #162,997 of 270,089Top 65%
1
Patents 2004