Issued Patents 2004
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6795802 | Apparatus and method for calculating temporal deterioration margin amount of LSI, and LSI inspection method | Hirokazu Yonezawa, Nobufusa Iwanishi | 2004-09-21 |
YK
Yoshiyuki Kawakami
Overall (2004): #82,832 of 270,089Top 35%
1
Patents 2004