Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6795802 | Apparatus and method for calculating temporal deterioration margin amount of LSI, and LSI inspection method | Hirokazu Yonezawa, Yoshiyuki Kawakami | 2004-09-21 |
| 6718529 | Method for calculation of cell delay time | — | 2004-04-06 |