Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6734549 | Semiconductor device having a device for testing the semiconductor | Sadami Takeoka, Osamu Ichikawa, Masayoshi Yoshimura | 2004-05-11 |
| 6708301 | Functional block for integrated circuit, semiconductor integrated circuit, inspection method for semiconductor integrated circuit, and designing method therefor | Sadami Takeoka, Toshihiro Hiraoka | 2004-03-16 |