Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6734549 | Semiconductor device having a device for testing the semiconductor | Sadami Takeoka, Mitsuyasu Ohta, Osamu Ichikawa | 2004-05-11 |
| 6708315 | Method of design for testability, method of design for integrated circuits and integrated circuits | Toshinori Hosokawa | 2004-03-16 |