YC

Younes Chtioui

SP Semiconductor Technologies & Instruments Pte: 1 patents #1 of 6Top 20%
📍 Dallas, TX: #131 of 508 inventorsTop 30%
🗺 Texas: #2,374 of 8,731 inventorsTop 30%
Overall (2004): #267,551 of 270,089Top 100%
1
Patents 2004

Issued Patents 2004

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6765666 System and method for inspecting bumped wafers Clyde Maxwell Guest, Rajiv Roy, Charles K. Harris, Weerakiat Wahawisan, Thomas Casey Carrington 2004-07-20