CG

Clyde Maxwell Guest

SP Semiconductor Technologies & Instruments Pte: 1 patents #1 of 6Top 20%
📍 Plano, TX: #64 of 471 inventorsTop 15%
🗺 Texas: #1,050 of 8,731 inventorsTop 15%
Overall (2004): #69,467 of 270,089Top 30%
2
Patents 2004

Issued Patents 2004

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6765666 System and method for inspecting bumped wafers Younes Chtioui, Rajiv Roy, Charles K. Harris, Weerakiat Wahawisan, Thomas Casey Carrington 2004-07-20
6744913 System and method for locating image features John Thornell 2004-06-01