Issued Patents 2004
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6794678 | Semiconductor integrated circuit device, method of testing semiconductor integrated circuit device and method of manufacturing semiconductor integrated circuit device | Masatoshi Hasegawa, Shuichi Miyaoka, Hiroshi Akasaki | 2004-09-21 |