Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6794678 | Semiconductor integrated circuit device, method of testing semiconductor integrated circuit device and method of manufacturing semiconductor integrated circuit device | Masatoshi Hasegawa, Shuichi Miyaoka, Masahiro Katayama | 2004-09-21 |
| 6735129 | Semiconductor integrated circuit device | Shuichi Miyaoka, Yuji Yokoyama, Masatoshi Hasegawa, Kozaburo Kurita | 2004-05-11 |