Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6740587 | Semiconductor device having a metal silicide layer and method for manufacturing the same | Jeong Hwan Yang, In-Sun Park, Byoung-Moon Yoon | 2004-05-25 |
| 6693446 | Apparatus for testing reliability of interconnection in integrated circuit | Jung Woo Kim, Chang-Sub Lee, Sam Young Kim, Young-Jin Wee, Ki-Chul Park | 2004-02-17 |
| 6690187 | Apparatus for testing reliability of interconnection in integrated circuit | Jung Woo Kim, Chang-Sub Lee, Sam Young Kim, Young-Jin Wee, Ki-Chul Park | 2004-02-10 |