Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6693446 | Apparatus for testing reliability of interconnection in integrated circuit | Won-sang Song, Jung Woo Kim, Chang-Sub Lee, Sam Young Kim, Young-Jin Wee | 2004-02-17 |
| 6690187 | Apparatus for testing reliability of interconnection in integrated circuit | Won-sang Song, Jung Woo Kim, Chang-Sub Lee, Sam Young Kim, Young-Jin Wee | 2004-02-10 |