Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6724204 | Probe structure for testing semiconductor devices and method for fabricating the same | Dong-il Cho | 2004-04-20 |
| 6689694 | Micromechanical system fabrication method using (111) single crystalline silicon | Dong-il Cho, Sangwoo Lee | 2004-02-10 |