Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6833721 | Method and apparatus for testing semiconductor devices using an actual board-type product | Chang-Nyun Kim, Hyun-Ho Park, Nam-Sik Jeong, Jong Hyun Kim, Chung-Koo Yoon | 2004-12-21 |
| 6819129 | Method and apparatus for testing a non-standard memory device under actual operating conditions | Chang-Nyun Kim, Sun-Ju Kim, Hyun-Ho Park, Jin-Seop Seo | 2004-11-16 |
| 6771088 | Method and apparatus for testing semiconductor devices using the back side of a circuit board | Chang-Nyun Kim, Sun-Ju Kim, Jong Hyun Kim, Chung-Koo Yoon | 2004-08-03 |