Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6833721 | Method and apparatus for testing semiconductor devices using an actual board-type product | Sang Jun Park, Chang-Nyun Kim, Nam-Sik Jeong, Jong Hyun Kim, Chung-Koo Yoon | 2004-12-21 |
| 6819129 | Method and apparatus for testing a non-standard memory device under actual operating conditions | Chang-Nyun Kim, Sang Jun Park, Sun-Ju Kim, Jin-Seop Seo | 2004-11-16 |