Issued Patents 2004
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6816429 | Integrated circuit capable of being burn-in tested using an alternating current stress and a testing method using the same | Sang-Jib Han, Choong-Keun Kwak, Yun-seung Shin | 2004-11-09 |