Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6816429 | Integrated circuit capable of being burn-in tested using an alternating current stress and a testing method using the same | Sang-Jib Han, Du-Eung Kim, Yun-seung Shin | 2004-11-09 |
| 6781899 | Semiconductor memory device and test method therof | Gong-Heum Han, Hyou-Youn Nam | 2004-08-24 |
| 6714463 | Semiconductor memory device having reduced chip select output time | Gong-Heum Han, Kyeong-Yoon Bae | 2004-03-30 |