Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6826298 | Automated wafer defect inspection system and a process of performing such inspection | Jeffrey O'Dell, Thomas Verburgt, Mark Harless | 2004-11-30 |
| 6773935 | Confocal 3D inspection system and process | David Vaughnn, Alan Blair | 2004-08-10 |
| 6731383 | Confocal 3D inspection system and process | Alan Blair | 2004-05-04 |