Issued Patents 2004
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6826298 | Automated wafer defect inspection system and a process of performing such inspection | Jeffrey O'Dell, Mark Harless, Cory Watkins | 2004-11-30 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6826298 | Automated wafer defect inspection system and a process of performing such inspection | Jeffrey O'Dell, Mark Harless, Cory Watkins | 2004-11-30 |