Issued Patents 2004
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6696849 | Fabrication method of semiconductor integrated circuit device and its testing apparatus | Naoto Ban, Masaaki Namba, Akio Hasebe, Yuji Wada, Ryuji Kohno +1 more | 2004-02-24 |