YC

Yoel Cohen

NI Nova Measuring Instruments: 2 patents #3 of 10Top 30%
Overall (2004): #33,955 of 270,089Top 15%
2
Patents 2004

Issued Patents 2004

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6720568 Method and system for optical inspection of a structure formed with a surface relief Moshe Finarov 2004-04-13
6704920 Process control for micro-lithography Boaz Brill 2004-03-09