JH

John D. Heaton

NI Nanometrics Incorporated: 1 patents #3 of 11Top 30%
📍 Fremont, CA: #284 of 868 inventorsTop 35%
🗺 California: #8,555 of 28,370 inventorsTop 35%
Overall (2004): #190,733 of 270,089Top 75%
1
Patents 2004

Issued Patents 2004

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6713753 Combination of normal and oblique incidence polarimetry for the characterization of gratings Pablo I. Rovira, Guorong V. Zhuang 2004-03-30