GZ

Guorong V. Zhuang

NI Nanometrics Incorporated: 1 patents #3 of 11Top 30%
📍 San Jose, CA: #938 of 2,805 inventorsTop 35%
🗺 California: #8,555 of 28,370 inventorsTop 35%
Overall (2004): #215,218 of 270,089Top 80%
1
Patents 2004

Issued Patents 2004

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6713753 Combination of normal and oblique incidence polarimetry for the characterization of gratings Pablo I. Rovira, John D. Heaton 2004-03-30