Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6738506 | Image processing system for multi-beam inspection | N. William Parker, Steven B. Hobmann | 2004-05-18 |
| 6734428 | Multi-beam multi-column electron beam inspection system | N. William Parker | 2004-05-11 |