RB

Raymond J. Beffa

Micron: 4 patents #199 of 948Top 25%
📍 Boise, ID: #102 of 590 inventorsTop 20%
🗺 Idaho: #139 of 1,066 inventorsTop 15%
Overall (2004): #12,430 of 270,089Top 5%
4
Patents 2004

Issued Patents 2004

Showing 1–4 of 4 patents

Patent #TitleCo-InventorsDate
6831475 Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer Warren M. Farnworth, William K. Waller, Leland R. Nevill, Eugene H. Cloud 2004-12-14
6815968 Reduced terminal testing system Warren M. Farnworth, Leland R. Nevill, Eugene H. Cloud 2004-11-09
6788993 Sorting a group of integrated circuit devices for those devices requiring special testing 2004-09-07
6703573 Method for sorting integrated circuit devices 2004-03-09