Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6807655 | Adaptive off tester screening method based on intrinsic die parametric measurements | Manu Rehani, David Abercrombie, Robert Madge | 2004-10-19 |
| 6787379 | Method of detecting spatially correlated variations in a parameter of an integrated circuit die | Robert Madge, Bruce Whitefield | 2004-09-07 |
| 6782500 | Statistical decision system | Robert Madge, Emery Sugasawara, W. Robert Daasch, James McNames, Daniel R. Bockelman | 2004-08-24 |