Issued Patents 2004
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6807655 | Adaptive off tester screening method based on intrinsic die parametric measurements | Kevin Cota, David Abercrombie, Robert Madge | 2004-10-19 |
MR
Manu Rehani
Overall (2004): #159,423 of 270,089Top 60%
1
Patents 2004