Issued Patents 2004
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6829730 | Method of designing circuit having multiple test access ports, circuit produced thereby and method of using same | Benoit Nadeau-Dostie | 2004-12-07 |
| 6763489 | Method for scan testing of digital circuit, digital circuit for use therewith and program product for incorporating test methodology into circuit description | Benoit Nadeau-Dostie | 2004-07-13 |
| 6760874 | Test access circuit and method of accessing embedded test controllers in integrated circuit modules | Benoit Nadeau-Dostie | 2004-07-06 |
| 6738938 | Method for collecting failure information for a memory using an embedded test controller | Benoit Nadeau-Dostie | 2004-05-18 |
| 6725435 | Method and program product for completing a circuit design having embedded test structures | Paul Price | 2004-04-20 |
| 6678875 | Self-contained embedded test design environment and environment setup utility | Brian John Pajak, Paul Price, Luc Romain | 2004-01-13 |