Issued Patents 2004
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6829730 | Method of designing circuit having multiple test access ports, circuit produced thereby and method of using same | Jean-Francois Cote | 2004-12-07 |
| 6763489 | Method for scan testing of digital circuit, digital circuit for use therewith and program product for incorporating test methodology into circuit description | Jean-Francois Cote | 2004-07-13 |
| 6760874 | Test access circuit and method of accessing embedded test controllers in integrated circuit modules | Jean-Francois Cote | 2004-07-06 |
| 6745359 | Method of masking corrupt bits during signature analysis and circuit for use therewith | — | 2004-06-01 |
| 6738938 | Method for collecting failure information for a memory using an embedded test controller | Jean-Francois Cote | 2004-05-18 |