Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6775350 | Method of examining a wafer of semiconductor material by means of X-rays | Catharina Huberta Henrica Emons, Henricus Godefridus Rafael Maas, Ronald Dekker, Antonius Johannes Janssen, Ingrid Rink | 2004-08-10 |
| 6762510 | Flexible integrated monolithic circuit | Johann-Heinrich Fock, Wolfgang Schnitt, Hauke Pohlmann, Andreas Gakis, Michael Burnus +3 more | 2004-07-13 |