Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6785973 | Measuring device comprising a movable measuring probe | — | 2004-09-07 |
| 6775350 | Method of examining a wafer of semiconductor material by means of X-rays | Catharina Huberta Henrica Emons, Henricus Godefridus Rafael Maas, Theodorus Martinus Michielsen, Ronald Dekker, Ingrid Rink | 2004-08-10 |