Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6791891 | Method of testing the thin oxide of a semiconductor memory cell that uses breakdown voltage | Jack Peng, Harry Luan, Jianguo Wang, Zhongshan Liu, Fei Ye | 2004-09-14 |
| 6777757 | High density semiconductor memory cell and memory array using a single transistor | Jack Peng | 2004-08-17 |