Issued Patents 2004
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6791891 | Method of testing the thin oxide of a semiconductor memory cell that uses breakdown voltage | Jack Peng, Harry Luan, Zhongshan Liu, David Fong, Fei Ye | 2004-09-14 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6791891 | Method of testing the thin oxide of a semiconductor memory cell that uses breakdown voltage | Jack Peng, Harry Luan, Zhongshan Liu, David Fong, Fei Ye | 2004-09-14 |