Issued Patents 2004
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6784680 | Contact probe with guide unit and fabrication method thereof | Tsuyoshi Haga, Katsuya Okumura, Nobuo Hayasaka, Noriaki Matsunaga | 2004-08-31 |
| 6781236 | Semiconductor device using a multilayer wiring structure | Yoshiaki Shimooka, Noriaki Matsunaga | 2004-08-24 |
| 6750138 | Semiconductor device of multi-wiring structure and method of manufacturing the same | Noriaki Matsunaga, Yoshiaki Shimooka, Kazuyuki Higashi | 2004-06-15 |
| 6724208 | Probe pin for testing electrical characteristics of apparatus, probe card using probe pins | Noriaki Matsunaga, Nobuo Hayasaka | 2004-04-20 |
| 6673704 | Semiconductor device and method of manufacturing the same | Junichi Wada, Atsuko Sakata, Tomio Katata, Takamasa Usui, Masahiko Hasunuma +3 more | 2004-01-06 |