XC

Xiaoming Chen

DP Dupont Photomasks: 1 patents #4 of 16Top 25%
📍 Shanghai, MI: #5 of 10 inventorsTop 50%
Overall (2004): #86,290 of 270,089Top 35%
1
Patents 2004

Issued Patents 2004

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6721695 Method and apparatus for evaluating the runability of a photomask inspection tool Charles H. Howard, Franklin D. Kalk, Kong Son, Paul Chipman 2004-04-13