Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6800406 | Method of generating optical assist features for two-mask exposure lithography | — | 2004-10-05 |
| 6774990 | Method to inspect patterns with high resolution photoemission | Ted Liang, Alan Stivers | 2004-08-10 |