Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6717431 | Method for semiconductor yield loss calculation | Dieter Rathei, Joerg Wohlfahrt, Luis G. Andrade, Thomas Steven Taylor, Babatunde Ashiru +3 more | 2004-04-06 |
| 6696349 | STI leakage reduction | Joerg Vollrath | 2004-02-24 |
| 6687170 | System and method for storing parity information in fuses | Ulrich Zimmerman | 2004-02-03 |