CG

Christopher Gould

Infineon Technologies Ag: 1 patents #395 of 1,096Top 40%
📍 Stanfordville, NY: #1 of 1 inventorsTop 100%
🗺 New York: #2,888 of 9,035 inventorsTop 35%
Overall (2004): #248,073 of 270,089Top 95%
1
Patents 2004

Issued Patents 2004

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6727989 Enhanced overlay measurement marks for overlay alignment and exposure tool condition control Xiaoming Yin, Gerhard Kunkel 2004-04-27