PE

Pierre Eyben

IV Interuniversitair Micro-Electronica Centrum Vzw: 1 patents #14 of 81Top 20%
Overall (2004): #136,648 of 270,089Top 55%
1
Patents 2004

Issued Patents 2004

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6823723 Method and apparatus for performing atomic force microscopy measurements Wilfried Vandervorst 2004-11-30