Issued Patents 2004
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6823723 | Method and apparatus for performing atomic force microscopy measurements | Pierre Eyben | 2004-11-30 |
| 6809317 | Method and apparatus for local surface analysis | — | 2004-10-26 |
| 6756584 | Probe tip and method of manufacturing probe tips by peel-off | Thomas Hantschel | 2004-06-29 |
| 6690008 | Probe and method of manufacturing mounted AFM probes | Thomas Hantschel | 2004-02-10 |