DM

Debra L. Meunier

IBM: 1 patents #1,866 of 5,464Top 35%
📍 Colchester, VT: #23 of 60 inventorsTop 40%
🗺 Vermont: #171 of 538 inventorsTop 35%
Overall (2004): #234,635 of 270,089Top 90%
1
Patents 2004

Issued Patents 2004

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6683306 Array foreshortening measurement using a critical dimension scanning electron microscope Reginald R. Bowley, Jr., Emily E. Fisch 2004-01-27