Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6823496 | Physical design characterization system | Bette L. Bergman Reuter, Mitchell R. DeHond, William C. Leipold, Brian D. Pfeifer, David C. Reynolds +1 more | 2004-11-23 |
| 6738954 | Method for prediction random defect yields of integrated circuits with accuracy and computation time controls | Archibald J. Allen, Wilm E. Donath, Alan Dziedzic, Mark A. Lavin, Dennis M. Newns +1 more | 2004-05-18 |