Issued Patents 2004
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6738954 | Method for prediction random defect yields of integrated circuits with accuracy and computation time controls | Archibald J. Allen, Wilm E. Donath, Mark A. Lavin, Daniel N. Maynard, Dennis M. Newns +1 more | 2004-05-18 |