Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6807115 | Method of testing a semiconductor integrated device | Kazuo Kanetani, Hiroaki Nambu, Kaname Yamasaki, Fumihiko Arakawa, Keiichi Higeta | 2004-10-19 |
| 6717877 | Semiconductor integration circuit device | Takeshi Suzuki, Shigeru Nakahara, Keiichi Higeta | 2004-04-06 |
| 6677782 | Semiconductor integrated circuit and semiconductor logic circuit used in the integrated circuit | Kazuo Kanetani, Hiroaki Nambu, Kaname Yamasaki, Keiichi Higeta, Kunihiko Yamaguchi +1 more | 2004-01-13 |